Title of article
A Low-Cost Concurrent BIST Scheme for Increased Dependability
Author/Authors
Ioannis Voyiatzis Constantin Halatsis ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
7
From page
150
To page
156
Keywords
input vector monitoring concurrent BIST. , concurrent testing , Built-in self test
Journal title
I E E E Transactions on Dependable and Secure Computing
Serial Year
2005
Journal title
I E E E Transactions on Dependable and Secure Computing
Record number
289455
Link To Document