Title of article :
Displacement measurements in structural elements by optical techniques
Author/Authors :
Gonz?lez-Pena، Rolando نويسنده , , Anda، Rosa Maria Cibrian-Ortiz de نويسنده , , Pino-Velazquez، Angel J نويسنده , , Cruz، José Soler-de la نويسنده , , Gonz?lez-Jorge، Yhoama نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-74
From page :
75
To page :
0
Abstract :
Speckle metrology and holographic interferometry (HI) have been used in several civil engineering applications. We present the results obtained by applying speckle photography (SP) to the study of two quadratic shearwalls with different boundary conditions, and the potential of the technique in the study of this kind of structures is described. The analysis of Youngʹs fringes obtained with this technique at certain points on each shearwall provides the whole field of displacement measurements. HI has been used to measure the three components of absolute displacement, verifying that the bulging phenomenon does not affect the in-plane components when the applied load remains on the same plane as the shearwall. A qualitative analysis is carried out following an electronic speckle pattern interferometry (ESPI) technique. The results obtained by optical techniques are compared to the numerical results obtained by the finite element method (FEM), finding good correlation between them in all the cases.
Keywords :
Excitable media , Current-voltage relationship , Bifurcation , Hodgkin-Huxley equation
Journal title :
OPTICS & LASERS IN ENGINEERING
Serial Year :
2000
Journal title :
OPTICS & LASERS IN ENGINEERING
Record number :
30157
Link To Document :
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