Title of article :
Simple method for measurement of surface roughness using spectral interferometry
Author/Authors :
Kandpal، H.C. نويسنده , , Mehta، D.S. نويسنده , , Vaishya، J.S. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-138
From page :
139
To page :
0
Abstract :
The phenomenon that correlation between two beams, in a two-beam interferometer, modifies the spectral characteristics of the light field, is used to estimate the average of the roughness of the surfaces. In the case of intensity interferometer, the path difference between the two arms of the interferometer should be less than the coherence length of the light and the light should be quasi-monochromatic. However, the advantage of spectral interferometer is that the light need not be quasi-monochromatic and the path difference could be much more than the coherence length of light. It is found that more the path difference between the two arms of the interferometer, accurate are the measurements of the roughness of the surfaces. This study shows that spectral interferometry enables one to measure average roughness of the surfaces in the subscales of optical wavelengths.
Keywords :
Bifurcation , Hodgkin-Huxley equation , Excitable media , Current-voltage relationship
Journal title :
OPTICS & LASERS IN ENGINEERING
Serial Year :
2000
Journal title :
OPTICS & LASERS IN ENGINEERING
Record number :
30159
Link To Document :
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