Title of article :
Nondestructive imaging of grain boundaries in polycrystalline materials using evanescent microwave probes
Author/Authors :
M. Tabib-Azar، نويسنده , , Werner R. Müller، نويسنده , , S. R. LeClair، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
16
From page :
549
To page :
564
Keywords :
Nondestructive characterization , Local probes , Hyperspectral imaging of local properties , quality control , Atomic resolution
Journal title :
Engineering Applications of Artificial Intelligence
Serial Year :
2000
Journal title :
Engineering Applications of Artificial Intelligence
Record number :
301640
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=301640
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