Title of article
Nondestructive imaging of grain boundaries in polycrystalline materials using evanescent microwave probes
Author/Authors
M. Tabib-Azar، نويسنده , , Werner R. Müller، نويسنده , , S. R. LeClair، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
16
From page
549
To page
564
Keywords
Nondestructive characterization , Local probes , Hyperspectral imaging of local properties , quality control , Atomic resolution
Journal title
Engineering Applications of Artificial Intelligence
Serial Year
2000
Journal title
Engineering Applications of Artificial Intelligence
Record number
301640
Link To Document