Title of article
3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope
Author/Authors
Petitgrand، S. نويسنده , , Yahiaoui، R. نويسنده , , Danaie، K. نويسنده , , Bosseboeuf، A. نويسنده , , Gilles، J.P. نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
-76
From page
77
To page
0
Abstract
Microscopic interferometry is a powerful technique for the static and dynamic characterization of micromechanical devices. In this paper we emphasize its capabilities for 3D vibration mode shapes profiling of Al cantilever microbeams and Cr micromachined membranes. It is demonstrated that time-resolved measurements up to 800kHz can be performed with a lateral resolution in the micrometer range and a vibration amplitude detection limit of 3-5nm. In addition, with reduced image sizes (256×256), quasi-real time (150-500ms) visualization of the vibration mode 3D profiles becomes possible. These performances were obtained by using stroboscopic illumination with an array of superluminescent LED and an optimized automatic fast Fourier transform phase demodulation of the interferograms. The results are compared with theoretical shapes of the vibration modes and with point measurements of the vibration spectra.
Keywords
Optical second harmonic generation , Silicon oxinitride , Non-linear optical method of investigations , Amorphous thin films
Journal title
OPTICS & LASERS IN ENGINEERING
Serial Year
2001
Journal title
OPTICS & LASERS IN ENGINEERING
Record number
30254
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