Title of article :
3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope
Author/Authors :
Petitgrand، S. نويسنده , , Yahiaoui، R. نويسنده , , Danaie، K. نويسنده , , Bosseboeuf، A. نويسنده , , Gilles، J.P. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
-76
From page :
77
To page :
0
Abstract :
Microscopic interferometry is a powerful technique for the static and dynamic characterization of micromechanical devices. In this paper we emphasize its capabilities for 3D vibration mode shapes profiling of Al cantilever microbeams and Cr micromachined membranes. It is demonstrated that time-resolved measurements up to 800kHz can be performed with a lateral resolution in the micrometer range and a vibration amplitude detection limit of 3-5nm. In addition, with reduced image sizes (256×256), quasi-real time (150-500ms) visualization of the vibration mode 3D profiles becomes possible. These performances were obtained by using stroboscopic illumination with an array of superluminescent LED and an optimized automatic fast Fourier transform phase demodulation of the interferograms. The results are compared with theoretical shapes of the vibration modes and with point measurements of the vibration spectra.
Keywords :
Optical second harmonic generation , Silicon oxinitride , Non-linear optical method of investigations , Amorphous thin films
Journal title :
OPTICS & LASERS IN ENGINEERING
Serial Year :
2001
Journal title :
OPTICS & LASERS IN ENGINEERING
Record number :
30254
Link To Document :
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