Title of article :
CD-R groove measurement by phase stepping interferometry
Author/Authors :
Sainov، V. نويسنده , , Mechkarov، N. نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
-428
From page :
429
To page :
0
Abstract :
The interferometric CD-R groove measurements in transmission and reflection mode with HeNe and Ar+ lasers are presented. The phase micro-inhomogeneities on the surface relief of polycarbonate substrates are compared with the surface relief of a stamping onto copper layer metal master for rainbow holograms, used as a test object. The grid density of the test object is about 60% higher than the density of the CD-R groove at a similar relief depth. The reason for the phase inhomogeneities is due to the refractive index variations of the polymer substrate. The RMS of the measurements is not higher than 0.1rad.
Keywords :
Optical second harmonic generation , Amorphous thin films , Silicon oxinitride , Non-linear optical method of investigations
Journal title :
OPTICS & LASERS IN ENGINEERING
Serial Year :
2001
Journal title :
OPTICS & LASERS IN ENGINEERING
Record number :
30271
Link To Document :
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