Title of article :
Defect dynamics of cement paste under repeated compression studied by electrical resistivity measurement
Author/Authors :
Sihai Wen، نويسنده , , D. D. L. Chung، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
1515
To page :
1518
Keywords :
Microcracking , Microstructure , electrical properties , Cement paste , Strain effect
Journal title :
CEMENT AND CONCRETE RESEARCH
Serial Year :
2001
Journal title :
CEMENT AND CONCRETE RESEARCH
Record number :
316618
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=316618
بازگشت