Title of article :
High-resolution x-ray scattering measurements: 1. Surfaces
Author/Authors :
Daillant، J نويسنده , , Albai، M نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
-1724
From page :
1725
To page :
0
Abstract :
X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquidvapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.
Keywords :
Quantum Lattice Systems , Ground State Euclidean Measures , Cluster Expansions , Uniqueness Problem
Journal title :
REPORTS ON PROSGRESS IN PHYSICS JOURNAL
Serial Year :
2000
Journal title :
REPORTS ON PROSGRESS IN PHYSICS JOURNAL
Record number :
31714
Link To Document :
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