Title of article
Characterization of oxygen impurity concentration in silicon based on thermal emission measurements
Author/Authors
V. K. Malyutenko، نويسنده , , V. I. Chernyakovsky، نويسنده , , T. Piotrowski، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
6
From page
499
To page
504
Journal title
Infrared Physics & Technology
Serial Year
1996
Journal title
Infrared Physics & Technology
Record number
327453
Link To Document