Title of article :
Determination of structural defects in Hg1−xCdxTe multilayer materials
Author/Authors :
Fuju Yu، نويسنده , , Dapeng Yu، نويسنده , , Xiaofeng Duan، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
7
From page :
265
To page :
271
Keywords :
Structural defects , Heterojunction of Hg~ xCd.~Te/CdTe/GaAs multilayer , X-ray diffraction , TEM
Journal title :
Infrared Physics & Technology
Serial Year :
1997
Journal title :
Infrared Physics & Technology
Record number :
327524
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=327524
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