مرکز منطقه ای اطلاع رساني علوم و فناوري - Silicon as a standard material for infrared reflectance and transmittance from 2 to 5 μm

Title of article :

Silicon as a standard material for infrared reflectance and transmittance from 2 to 5 μm

Author/Authors :

Simon G. Kaplan، نويسنده , , Leonard M. Hanssen، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

389

To page :

396

Keywords :

Reflectance , polarization , Infrared , Index of refraction , transmittance

Journal title :

Infrared Physics & Technology

Serial Year :

2002

Journal title :

Infrared Physics & Technology

Record number :

327797

Link To Document :