مرکز منطقه ای اطلاع رساني علوم و فناوري - Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry

Title of article :

Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry

Author/Authors :

P. Adamson، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

561

To page :

568

Keywords :

Optical diagnostics , Nanoscale %lms , Di(erential re)ectivity , Ellipsometry

Journal title :

OPTICS & LASER TECHNOLOGY

Serial Year :

2002

Journal title :

OPTICS & LASER TECHNOLOGY

Record number :

334866

Link To Document :