مرکز منطقه ای اطلاع رساني علوم و فناوري - Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry

Title of article :

Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry

Author/Authors :

P. Adamson، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2004

Pages :

From page :

661

To page :

668

Keywords :

Optical diagnostics , Ellipsometry , Diיerential re(ectivity , Nanoscale $lms

Journal title :

OPTICS & LASER TECHNOLOGY

Serial Year :

2004

Journal title :

OPTICS & LASER TECHNOLOGY

Record number :

335114

Link To Document :