Title of article
Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry
Author/Authors
P. Adamson، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
8
From page
661
To page
668
Keywords
Optical diagnostics , Ellipsometry , Diיerential re(ectivity , Nanoscale $lms
Journal title
OPTICS & LASER TECHNOLOGY
Serial Year
2004
Journal title
OPTICS & LASER TECHNOLOGY
Record number
335114
Link To Document