مرکز منطقه ای اطلاع رساني علوم و فناوري - Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite

Title of article :

Polarized EXAFS, distance-valence least-squares modeling (DVLS), and quantitative texture analysis approaches to the structural refinement of Garfield nontronite

Author/Authors :

A. Manceau، نويسنده , , D. Chateigner، نويسنده , , W. P. Gates ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1998

Pages :

From page :

347

To page :

365

Journal title :

Physics and Chemistry of Minerals

Serial Year :

1998

Journal title :

Physics and Chemistry of Minerals

Record number :

336200

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=336200