Title of article :
Characterization and Parasitic Extraction of EMI Filters Using Scattering Parameters.
Author/Authors :
S. Wang، نويسنده , , F. C. Lee، نويسنده , , W. G. Odendaal، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
502
To page :
510
Keywords :
insertionloss , parasitic coupling , scattering parameters , insertion voltage gain , Tee network. , Electromagnetic interference (EMI) filter
Journal title :
IEEE TRANSACTIONS ON POWER ELECTRONICS
Serial Year :
2005
Journal title :
IEEE TRANSACTIONS ON POWER ELECTRONICS
Record number :
340656
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=340656
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