Title of article :
Characterization and Modeling of Parasitic Emission in Deep Submicron CMOS.
Author/Authors :
B. Vrignon، نويسنده , , S. D. Bendhia، نويسنده , , E. Lamoureux، نويسنده , , E. Sicard، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
6
From page :
382
To page :
387
Keywords :
electromagnetic interference(EMI) modeling , electromagnetic compatability (EMC) , Complementary metal–oxide semiconductor (CMOS)technology , on-chip sampling.
Journal title :
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Serial Year :
2005
Journal title :
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Record number :
341538
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=341538
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