Title of article :
Traces in Proximity to Gaps in Return Planes.
Author/Authors :
T. M. Zeeff، نويسنده , , T. H. Hubing، نويسنده , , and T. P. Van Doren، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
5
From page :
388
To page :
392
Keywords :
Isolation , moating , mutual capacitance , mutual inductance , printed circuit board. , Analog , common-impedance , coupling , digital , gapped , ground islands , ground plane
Journal title :
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Serial Year :
2005
Journal title :
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Record number :
341539
Link To Document :
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