مرکز منطقه ای اطلاع رساني علوم و فناوري - Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method

Title of article :

Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method

Author/Authors :

Y.J. Liu، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

940

To page :

948

Keywords :

Fast Multipole Method , Electrostatic problems , Boundary element method , MEMS

Journal title :

Engineering Analysis with Boundary Elements

Serial Year :

2005

Journal title :

Engineering Analysis with Boundary Elements

Record number :

348858

Link To Document :