Title of article :
Application of bimaterial interface corner failure mechanics to silicon/glass anodic bonds
Author/Authors :
Paul E. W. Labossiere، نويسنده , , Martin L. Dunn ، نويسنده , , Shawn J. Cunningham، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
29
From page :
405
To page :
433
Keywords :
Crack initiation , A. Stress intensity factor , failure mechanism , Interface corner
Journal title :
Journal of the Mechanics and Physics of Solids
Serial Year :
2002
Journal title :
Journal of the Mechanics and Physics of Solids
Record number :
354489
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=354489
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