Title of article
A phase field model for failure in interconnect lines due to coupled diffusion mechanisms
Author/Authors
Deepali N. Bhate، نويسنده , , Allan F. Bower ، نويسنده , , Ashish Kumar Varshney and Umesh Chandra Joshi ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
27
From page
2057
To page
2083
Keywords
A. Di&usion , A. Electromigration , B. Voids , C. Finite elements
Journal title
Journal of the Mechanics and Physics of Solids
Serial Year
2002
Journal title
Journal of the Mechanics and Physics of Solids
Record number
354555
Link To Document