Imaging, spectroscopy and spectroscopic imaging with an energy filtered field emission TEM

G. A. Botton ، نويسنده , , M. W. Phaneuf، نويسنده ,

روزنامه با شماره پیاپی سال 1999

11

109

119

spatial resolution , Semiconductor devices , Dielectric layers , O–N–O , Grainboundaries , Segregation , Field emission transmission electron microscopy , Focussed ion beam , elemental mapping , Energy filtered microscopy , Near-edge structure

Micron

1999

Micron

356770