Title of article
EDX spectrum modelling and multivariate analysis of sub-nanometer segregation
Author/Authors
J. M. Titchmarsh، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
13
From page
159
To page
171
Keywords
multivariate statistical analysis , X-ray analysis , Spectrum modelling , High spatial resolution , Field emission electron source-scanning transmission electron microscope , Energy dispersive X-ray , Analytical electron microscopy
Journal title
Micron
Serial Year
1999
Journal title
Micron
Record number
356777
Link To Document