EDX spectrum modelling and multivariate analysis of sub-nanometer segregation
Author/Authors :
J. M. Titchmarsh، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
13
From page :
159
To page :
171
Keywords :
multivariate statistical analysis , X-ray analysis , Spectrum modelling , High spatial resolution , Field emission electron source-scanning transmission electron microscope , Energy dispersive X-ray , Analytical electron microscopy
