Title of article :
A review of focused ion beam milling techniques for TEM specimen preparation
Author/Authors :
L. A. Giannuzzi ، نويسنده , , F. A. Stevie، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Keywords :
Transmission electron microscopy (TEM) , scanning electron microscopy (SEM) , Secondary ion mass spectrometry (SIMS) , Focused ion beam
