مرکز منطقه ای اطلاع رساني علوم و فناوري - Defects caused by high-energy ion beams, as measured by scanning probe methods

Title of article :

Defects caused by high-energy ion beams, as measured by scanning probe methods

Author/Authors :

L. P. Biro، نويسنده , , J. Gyulai، نويسنده , , G. I. Mark ، نويسنده , , Cs. S. Daroczi، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 1999

Pages :

From page :

245

To page :

254

Keywords :

Ion-beam damage , Atomic force microscopy , Scanning tunneling microscopy

Journal title :

Micron

Serial Year :

1999

Journal title :

Micron

Record number :

356786

Link To Document :