Title of article
Defects caused by high-energy ion beams, as measured by scanning probe methods
Author/Authors
L. P. Biro، نويسنده , , J. Gyulai، نويسنده , , G. I. Mark ، نويسنده , , Cs. S. Daroczi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
10
From page
245
To page
254
Keywords
Ion-beam damage , Atomic force microscopy , Scanning tunneling microscopy
Journal title
Micron
Serial Year
1999
Journal title
Micron
Record number
356786
Link To Document