• Title of article

    The use of through focus exit wave reconstruction and quantitative electron diffraction in the structure determination of superconductors

  • Author/Authors

    H. W. Z، نويسنده , , bergen، نويسنده , , R. Bokel، نويسنده , , E. Connolly ، نويسنده , , J. Jansen، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    22
  • From page
    395
  • To page
    416
  • Keywords
    Electron microscopy , Through focus exit wave reconstruction , Atomic structure determination , Superconducting films
  • Journal title
    Micron
  • Serial Year
    1999
  • Journal title
    Micron
  • Record number

    356800

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356800