Title of article :
Morphological and structural effects of excimer laser treatment of amorphous silicon
Author/Authors :
S. Loreti، نويسنده , , D. della Sala ، نويسنده , , M. Garozzo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
9
From page :
299
To page :
307
Keywords :
Silicon , laser , recrystallization , Thin film , Channelling , SCANNING ELECTRON MICROSCOPY , polycrystals , orientation , Xraydiffraction , Crystallite size , Atomic force microscopy
Journal title :
Micron
Serial Year :
2000
Journal title :
Micron
Record number :
356847
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356847
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