• Title of article

    A tilting procedure to enhance compositional contrast and reduce residual diffraction contrast in energy-filtered TEM imaging of planar interfaces

  • Author/Authors

    K. T. Moore، نويسنده , , E. A. Stach، نويسنده , , J. M. Howe، نويسنده , , D. C. Elbert ، نويسنده , , D. R. Veblen ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2002
  • Pages
    13
  • From page
    39
  • To page
    51
  • Keywords
    Energy-®ltered transmission electron microscopy (EFTEM) , signal-to-noise ratio (SNR) , electron energy-loss spectroscopy (EELS) , Energy-®ltered image (EFI) , Elemental map , Jump-ratio image , Semiconductor interfaces
  • Journal title
    Micron
  • Serial Year
    2002
  • Journal title
    Micron
  • Record number

    356985

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=356985