Title of article
A new type of scanning electron microscope using the coaxial backscattered electrons
Author/Authors
C. Z. Jiang، نويسنده , , P. Morin، نويسنده , , N. Rosenberg، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
6
From page
69
To page
74
Keywords
Compositionanalysis , Backscattered electron , Monte Carlo simulation , Backscattering coef®cient , Coaxial detection , Scanning electron microscope
Journal title
Micron
Serial Year
2002
Journal title
Micron
Record number
356988
Link To Document