Title of article
Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing
Author/Authors
J. Chen ، نويسنده , , D. G. Ivey، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
4
From page
489
To page
492
Keywords
Wedge polishing , GaN-based semiconductor , TRANSMISSION ELECTRON MICROSCOPY , Metallization
Journal title
Micron
Serial Year
2002
Journal title
Micron
Record number
357025
Link To Document