Title of article :
Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing
Author/Authors :
J. Chen ، نويسنده , , D. G. Ivey، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Keywords :
Wedge polishing , GaN-based semiconductor , TRANSMISSION ELECTRON MICROSCOPY , Metallization
