Title of article

Transmission electron microscopy for the semi-conductor industry

Author/Authors

Hong Zhang، نويسنده ,

Issue Information

روزنامه با شماره پیاپی سال 2002

Pages

7

From page

515

To page

521

Keywords

Transmission electron microscopy , Semi-conductor , sample preparation

Journal title

Micron

Serial Year

2002

Journal title

Micron

Record number

357029