Title of article :
Transmission electron microscopy for the semi-conductor industry
Author/Authors :
Hong Zhang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Pages :
7
From page :
515
To page :
521
Keywords :
Transmission electron microscopy , Semi-conductor , sample preparation
Journal title :
Micron
Serial Year :
2002
Journal title :
Micron
Record number :
357029
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=357029
