Application of automated crystallography for transmission electron microscopy in the study of grain-boundary segregation

Chunfei Li and Yi Qin، نويسنده , , David B. Williams ، نويسنده ,

روزنامه با شماره پیاپی سال 2003

11

199

209

Grain-boundary segregation , analytical electron microscopy , Energy-dispersive spectrometry , transmission electron microscope , Cu–Sb alloy , Automated crystallography

Micron

2003

Micron

357071