مرکز منطقه ای اطلاع رساني علوم و فناوري - The application of FIB milling for specimen preparation from crystalline germanium

Title of article :

The application of FIB milling for specimen preparation from crystalline germanium

Author/Authors :

A. S. Rubanov، نويسنده , , P. R. Munroe ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2004

Pages :

From page :

549

To page :

556

Keywords :

Focused ion beam , sample preparation , sample preparation , damage , TRANSMISSION ELECTRON MICROSCOPY , germanium

Journal title :

Micron

Serial Year :

2004

Journal title :

Micron

Record number :

357190

Link To Document :