Title of article
Atomic resolution STEM analysis of defects and interfaces in ceramic materials
Author/Authors
R.F. Klie ، نويسنده , , Y. Zhu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
13
From page
219
To page
231
Keywords
STEM , HAADF , Z-contrast imaging , SrTiO3 , TiO2-LaAlO3 , EELS , MgB2
Journal title
Micron
Serial Year
2005
Journal title
Micron
Record number
357233
Link To Document