Title of article
Comparison of Si and Ge low-loss spectra to interpret the Ge contrast in EFTEM images of Si1−x Gex nanostructures
Author/Authors
R. Pantel، نويسنده , , M.C. Cheynet ، نويسنده , , F.D. Tichelaar، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
9
From page
657
To page
665
Keywords
Energy filtered TEM , Energy loss spectroscopy , Si–Ge , Microelectronics
Journal title
Micron
Serial Year
2006
Journal title
Micron
Record number
357370
Link To Document