Application of focused ion beam (FIB) microscopy to the study of crack profiles

Wang، نويسنده , , Revie، نويسنده , , Phaneuf ، نويسنده , , Li، نويسنده ,

روزنامه با شماره پیاپی سال 1999

6

251

256

focused ion beam microscopy • crack aspect ratios • pipeline steel • corrosion pits • non-metallic inclusions • simulated groundwater • nanotechnology

Fatigue and Fracture of Engineering Materials and Structures

1999

Fatigue and Fracture of Engineering Materials and Structures

359250