Title of article
Application of focused ion beam (FIB) microscopy to the study of crack profiles
Author/Authors
Wang، نويسنده , , Revie، نويسنده , , Phaneuf ، نويسنده , , Li، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
6
From page
251
To page
256
Keywords
focused ion beam microscopy • crack aspect ratios • pipeline steel • corrosion pits • non-metallic inclusions • simulated groundwater • nanotechnology
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Serial Year
1999
Journal title
Fatigue and Fracture of Engineering Materials and Structures
Record number
359250
Link To Document