Influence of nanometre-sized notch and water on the fracture behaviour of single crystal silicon microelements

K. Minoshima، نويسنده , , T. Terada ، نويسنده , , K. Komai، نويسنده ,

روزنامه با شماره پیاپی سال 2000

8

1033

1040

atomic force microscopy , Focused ion beam , Fractography , Fracture , micromaterial , nanofractography , Notch , SCANNING ELECTRON MICROSCOPY , single-crystal silicon , micromachine , water. , Fatigue

Fatigue and Fracture of Engineering Materials and Structures

2000

Fatigue and Fracture of Engineering Materials and Structures

359415