Title of article :
Fatigue and fracture of a Ni–P amorphous alloy thin film on the micrometer scale
Author/Authors :
K. TAKASHIMA، نويسنده , , Y. Higo، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Keywords :
Reliability. , microscale testing , MST , durability , Fracture , MEMS , Fatigue
Journal title :
Fatigue and Fracture of Engineering Materials and Structures
Journal title :
Fatigue and Fracture of Engineering Materials and Structures
