Characterization of single crystal silicon and electroplated nickel films by uniaxial tensile test with in situ X-ray diffraction measurement

T. NAMAZU، نويسنده , , S. Inoue and H. Akagi، نويسنده ,

روزنامه با شماره پیاپی سال 2007

8

13

20

XRD tensile test , out-of-plane elastic strain , Young’s modulus , Poisson’sratio , single crystal silicon , electroplated nickel , size effect.

Fatigue and Fracture of Engineering Materials and Structures

2007

Fatigue and Fracture of Engineering Materials and Structures

360004