Title of article :
Automating test generation for discrete event oriented embedded systems
Author/Authors :
Steven J. Cunning and Jerzy W. Rozenblit ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Keywords :
embedded systems. , Test Pattern Generation , requirements modeling
Journal title :
Journal of Intelligent and Robotic Systems
Journal title :
Journal of Intelligent and Robotic Systems
