Title of article :
Mismatch Characterization of Submicron MOS Transistors
Author/Authors :
J. Bastos، نويسنده , , M. Steyaert، نويسنده , , A. Pergoot and W. Sansen، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1997
Pages :
12
From page :
95
To page :
106
Keywords :
mismatch. characterization , f\.10S transistors
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
1997
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
366793
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=366793
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