Title of article :
Design and Analysis of Built-In Testers for CMOS Switched-Current Circuits
Author/Authors :
Cheng-Ping Wang and Chin-Long Wey، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Keywords :
cyclic A/D converters , Switched-Current technique , built-in testers , mixed-signal circuits , voltagewindow comparator , current comparator
Journal title :
Analog Integrated Circuits and Signal Processing
Journal title :
Analog Integrated Circuits and Signal Processing