Accurate Characterization of Silicon-On-Insulator MOSFETs for the Design of Low-Voltage, Low-Power RF Integrated Circuits

J.-P. Raskin، نويسنده , , R. Gilon، نويسنده , , G. Dambrine، نويسنده , , J. Chen، نويسنده , , D. Vanhoenacker and J.-P. Colinge ، نويسنده ,

روزنامه با شماره پیاپی سال 2000

23

133

155

integrated circuit measurements , microwave measurements , MOSFETs , scattering parametersmeasurements , silicon-on-insulator technology

Analog Integrated Circuits and Signal Processing

2000

Analog Integrated Circuits and Signal Processing

367084