مرکز منطقه ای اطلاع رساني علوم و فناوري - Demonstration of an Analog IC Function Maintenance Strategy, Including Direct Calibration, Built-in Self-test, and Commutation of Redundant Functional Blocks

Title of article :

Demonstration of an Analog IC Function Maintenance Strategy, Including Direct Calibration, Built-in Self-test, and Commutation of Redundant Functional Blocks

Author/Authors :

K. Wayne Current and Wei-Shang Chu ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2001

Pages :

From page :

129

To page :

140

Keywords :

analog testability , built-in self-test , Redundancy

Journal title :

Analog Integrated Circuits and Signal Processing

Serial Year :

2001

Journal title :

Analog Integrated Circuits and Signal Processing

Record number :

367104

Link To Document :

https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367104