• Title of article

    Demonstration of an Analog IC Function Maintenance Strategy, Including Direct Calibration, Built-in Self-test, and Commutation of Redundant Functional Blocks

  • Author/Authors

    K. Wayne Current and Wei-Shang Chu ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    12
  • From page
    129
  • To page
    140
  • Keywords
    analog testability , built-in self-test , Redundancy
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Serial Year
    2001
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Record number

    367104

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367104