Title of article
Parametric Yield Optimization of MOS ICʹs Affected by Device Mismatch
Author/Authors
Massimo Conti، نويسنده , , Paolo Crippa، نويسنده , , Simone Orcioni and Claudio Turchetti ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
19
From page
181
To page
199
Keywords
device mismatch , parametric yield , optimization , statistical variations
Journal title
Analog Integrated Circuits and Signal Processing
Serial Year
2001
Journal title
Analog Integrated Circuits and Signal Processing
Record number
367170
Link To Document