مرکز منطقه ای اطلاع رساني علوم و فناوري - Incorporating Voltage Fluctuations of the Power Distribution Network into the Transient Analysis of CMOS Logic Gates

Title of article :

Incorporating Voltage Fluctuations of the Power Distribution Network into the Transient Analysis of CMOS Logic Gates

Author/Authors :

Kevin T. Tang and Eby G. Friedman ، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2002

Pages :

From page :

249

To page :

259

Keywords :

power distribution network , IR drops , system-on-a-chip

Journal title :

Analog Integrated Circuits and Signal Processing

Serial Year :

2002

Journal title :

Analog Integrated Circuits and Signal Processing

Record number :

367214

Link To Document :