Title of article :
Automated System-Level Test Development for Mixed-Signal Circuits
Author/Authors :
Sule Ozev and Alex Orailoglu ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Keywords :
analog test , high-level modeling , para metric test , Test coverage
Journal title :
Analog Integrated Circuits and Signal Processing
Journal title :
Analog Integrated Circuits and Signal Processing
