• Title of article

    An Integrated CAD Methodology for Yield Enhancement of VLSI CMOS Circuits Including Statistical Device Variations

  • Author/Authors

    Massimo Conti، نويسنده , , Paolo Crippa، نويسنده , , Simone Orcioni، نويسنده , , Marcello Pesare، نويسنده , , Simone Orcioni and Claudio Turchetti ، نويسنده , , Loris Vendrame and Silvia Lucherini ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    18
  • From page
    85
  • To page
    102
  • Keywords
    parametric yield , device mismatch , optimization , statistical process variations , CAD tool
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Serial Year
    2003
  • Journal title
    Analog Integrated Circuits and Signal Processing
  • Record number

    367373

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367373