Title of article :
Symbolic Techniques for the Selection of Test Frequencies in Analog Fault Diagnosis
Author/Authors :
F. Grasso، نويسنده , , A. Luchetta، نويسنده , , S. Manetti and M.C. Piccirilli ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
9
From page :
205
To page :
213
Keywords :
ambiguity groups , analog system testing , Testability analysis , Condition number
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
2004
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
367424
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367424
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