Automatic Window Repositioning Technique for Digital Window Comparator Used Within Mixed-Signal Design-for Testability Schemes

Daniela De Venuto، نويسنده , , Michael J. Ohletz and Bruno Ricc? ، نويسنده ,

روزنامه با شماره پیاپی سال 2005

11

301

311

GO/NOGO test , signal level evaluation , Characterisation , on-chip Dc level check , mixed-signal ASIC , DFT , window comparator

Analog Integrated Circuits and Signal Processing

2005

Analog Integrated Circuits and Signal Processing

367482