Title of article
Automatic Window Repositioning Technique for Digital Window Comparator Used Within Mixed-Signal Design-for Testability Schemes
Author/Authors
Daniela De Venuto، نويسنده , , Michael J. Ohletz and Bruno Ricc? ، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
11
From page
301
To page
311
Keywords
GO/NOGO test , signal level evaluation , Characterisation , on-chip Dc level check , mixed-signal ASIC , DFT , window comparator
Journal title
Analog Integrated Circuits and Signal Processing
Serial Year
2005
Journal title
Analog Integrated Circuits and Signal Processing
Record number
367482
Link To Document