Title of article :
CMOS blocks for on-chip RF test
Author/Authors :
Rashad Ramzan and Jerzy D?browski ، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2006
Pages :
10
From page :
151
To page :
160
Keywords :
RF test . Loopback test . DfT . Radiotransceivers . RF-CMOS design . RF frontend
Journal title :
Analog Integrated Circuits and Signal Processing
Serial Year :
2006
Journal title :
Analog Integrated Circuits and Signal Processing
Record number :
367697
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=367697
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